#include "test_env.h" /****************************************************************************** * This will test an I2C EEPROM connected to mbed by writing a predefined byte at * address 0 and then reading it back and comparing it with the known byte value a * number of times. This test was written specifically for reproducing the bug * reported here: * * https://mbed.org/forum/bugs-suggestions/topic/4128/ * * Test configuration: * * set 'ntests' to the number of iterations * set 'i2c_speed_hz' to the desired speed of the I2C interface * set 'i2c_delay_us' to the delay that will be inserted between 'write' and * 'read' I2C operations (https://mbed.org/users/mbed_official/code/mbed/issues/1 * for more details). '0' disables the delay. * define I2C_EEPROM_VERBOSE to get verbose output * * The test ran with a 24LC256 external EEPROM memory, but any I2C EEPROM memory * that uses two byte addresses should work. ******************************************************************************/ #if defined(TARGET_KL25Z) I2C i2c(PTC9, PTC8); #elif defined(TARGET_KL46Z) I2C i2c(PTC9, PTC8); #elif defined(TARGET_K64F) I2C i2c(PTE25, PTE24); #elif defined(TARGET_K22F) I2C i2c(PTE0, PTE1); #elif defined(TARGET_K20D50M) I2C i2c(PTB3, PTB2); #elif defined(TARGET_LPC812) I2C i2c(P0_10, P0_11); #elif defined(TARGET_LPC1549) I2C i2c(P0_23, P0_22); #elif defined(TARGET_LPC11U68) I2C i2c(SDA, SCL); #elif defined(TARGET_DELTA_DFCM_NNN40) I2C i2c(I2C_SDA0, I2C_SCL0); #elif defined(TARGET_NUCLEO_F030R8) || \ defined(TARGET_NUCLEO_F070RB) || \ defined(TARGET_NUCLEO_F072RB) || \ defined(TARGET_NUCLEO_F091RC) || \ defined(TARGET_NUCLEO_F103RB) || \ defined(TARGET_NUCLEO_F302R8) || \ defined(TARGET_NUCLEO_F303RE) || \ defined(TARGET_NUCLEO_F334R8) || \ defined(TARGET_NUCLEO_F401RE) || \ defined(TARGET_NUCLEO_F411RE) || \ defined(TARGET_NUCLEO_L053R8) || \ defined(TARGET_NUCLEO_L073RZ) || \ defined(TARGET_NUCLEO_L152RE) || \ defined(TARGET_FF_ARDUINO) I2C i2c(I2C_SDA, I2C_SCL); #else I2C i2c(p28, p27); #endif namespace { const int ntests = 10000; const int i2c_freq_hz = 400000; const int i2c_delay_us = 0; } int main() { MBED_HOSTTEST_TIMEOUT(15); MBED_HOSTTEST_SELECT(default_auto); MBED_HOSTTEST_DESCRIPTION(I2C EEPROM read write test); MBED_HOSTTEST_START("MBED_A19"); const int EEPROM_MEM_ADDR = 0xA0; const char MARK = 0x66; int fw = 0; int fr = 0; int fc = 0; int i2c_stat = 0; bool result = true; i2c.frequency(i2c_freq_hz); printf("I2C: I2C Frequency: %d Hz\r\n", i2c_freq_hz); printf("I2C: Write 0x%2X at address 0x0000 test ... \r\n", MARK); // Data write { char data[] = { 0, 0, MARK }; if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, sizeof(data))) != 0) { printf("Unable to write data to EEPROM (i2c_stat = 0x%02X), aborting\r\n", i2c_stat); notify_completion(false); return 1; } // ACK polling (assumes write will be successful eventually) while (i2c.write(EEPROM_MEM_ADDR, data, 0) != 0) ; } printf("I2C: Read data from address 0x0000 test ... \r\n"); // Data read (actual test) for (int i = 0; i < ntests; i++) { // Write data to EEPROM memory { char data[] = { 0, 0 }; if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, 2, true)) != 0) { printf("Test %d failed at write, i2c_stat is 0x%02X\r\n", i, i2c_stat); fw++; continue; } } // us delay if specified if (i2c_delay_us != 0) wait_us(i2c_delay_us); // Read data { char data[1] = { 0 }; if ((i2c_stat = i2c.read(EEPROM_MEM_ADDR, data, 1)) != 0) { printf("Test %d failed at read, i2c_stat is 0x%02X\r\n", i, i2c_stat); fr++; continue; } if (data[0] != MARK) { printf("Test %d failed at data match\r\n", i); fc++; } } } result = (fw + fr + fc == 0); printf("EEPROM: Test result ... [%s]\r\n", result ? "OK" : "FAIL"); if (!result) { printf("Test Statistics:\r\n"); printf("\tTotal tests: %d\r\n", ntests); printf("\tFailed at write: %d\r\n", fw); printf("\tFailed at read: %d\r\n", fr); printf("\tData mismatch: %d\r\n", fc); printf("\tTotal failures: %d\r\n", fw + fr + fc); } MBED_HOSTTEST_RESULT(result); }